Specialized AFM
PARK NX12
The ideal choice for biological and electrochemical studies
PARK NX12
Description:
NX12 is a specialized atomic force microscope (AFM) for materials science, electrochemical, and biochemical research. It delivers nanoscale imaging and property characterization in both liquid and ambient environments, integrating scanning probe techniques with inverted optical microscopy for comprehensive analysis of dynamic processes.
At its core, NX12 combines Park’s True Non-contact™ mode and an orthogonal scan system with nanopipette-based techniques, enabling precise topography and correlative measurements that connect structural, mechanical, electrical, and optical information on the same sample.
NX12 supports a variety of specialized experiments, including non-invasive in-liquid imaging of live cells with SICM and high-resolution mapping of local reactivity with SECM/SECCM. Its digitally controlled environmental chamber maintains stable gas and temperature conditions for reliable, reproducible research.
Key Features:
- Specialized Bio AFM & Electrochemical Capabilities
- Integration with Inverted Optical Microscopy
- In-Liquid AFM Imaging for Biological Applications
- Environmental Control Chamber
- Nanopipette-Based Applications
Outstanding AFM Performance:
- True Non-Contact™ Mode
- Orthogonal Scan System
- Fast Z-Servo Speed
- Easy Probe Exchange
- Comprehensive Selection of AFM Modes
Specification:
-
Scanner
XY scanner (100 µm × 100 µm)
Flexure-guided high-force Z scanner (15 µm or 30 µm) -
On-axis Optics Microscope
Direct on-axis vision of sample surface and cantilever
Field of view: 840 µm × 630 µm (w/ 10× objective lens)
CCD: 5 M Pixel -
Stage
XY stage: 10 mm × 10 mm
Z stage: 25 mm
Focus stage: 15 mm
Applications:
- Unique applications: Giardia in liquid, Lung cancer cell, Sunflower pollen, Cellguard
- Material & Chemistry: 2D material, Polymer, Blended Polymer, Plastic, Coating, Thin film, Catalyst
- Life Science: Fixed or Living cell membrane, Biomolecular interaction, Tissue, DNA, Bacteria or Virus
- Metal & Semiconductor: Failure analysis on Semiconductor device, Measurements on nanoelectronic device, Thin-film electronics component
- Battery & Energy: Battery material, Fuel cell, Energy harvesting, Ionic conductor
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