Small Sample AFM
PARK NX7
Accessible nanometrology for academic research
PARK NX7
Description:
Park NX7 is a compact atomic force microscope (AFM) designed for accessible nanoscale research. Its table-top format makes it especially suitable for educational environments and laboratories with limited space, while still delivering reliable high-resolution imaging.
At the core of NX7 are Park’s proprietary orthogonal scan system and True Non-contact™ mode, innovations that virtually eliminate lateral motion artifacts while protecting both tip and sample. Together, these technologies ensure artifact-free, high-resolution imaging even for the most delicate or challenging samples.
From materials science to polymers and bioengineering, NX7 delivers robust performance and dependable results, making it a trusted platform for advanced nanoscale metrology.
Key Features:
- Outstanding NX Mechanical Design
- Fast Z Servo and High Resolution
- NX Laser Beam Path
- Pre-Mounted Probe
- Improved Z Scan Straightness
- On-Axis Optical Microscope
- Orthogonal Scan System
- Park AFM True Non-Contact™ Mode
- Easy, intuitive SLD beam alignment
Specification:
-
Scanner - Z-scan range: 15 µm (optional 30 µm)
X-Y scan range: 50 µm × 50 µm (optional 10 µm × 10 µm or 100 µm × 100 µm) -
Stage - Z stage range: 26 mm
XY stage range: 13 mm x 13 mm -
Sample Dimension - Sample size: Up to 50 mm
Thickness: Up to 20 mm -
Software - Park SmartScanTM
Park SmartAnalysisTM
Applications:
- Material & Chemistry: Few-layer MnBi₂Te₄ (MBT), surface of PVDF, Graphene on hexagonal boron nitride Blended Polymer, Plastic, Coating, Thin film, Catalyst
- Life Science: adenovirus sample with a DNA bundle, Fixed or Living cell membrane, Biomolecular interaction, Tissue, DNA, Bacteria or Virus
- Metal & Semiconductor: Failure analysis on Semiconductor device, Measurements on nanoelectronic device, Thin-film electronics component
- Battery & Energy: Battery material, Fuel cell, Energy harvesting, Ionic conductor
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